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BIT technology and equipment control system fault diagnosis – laboratory equipment – Education Industry
Introduction into the built-in test (BIT) 70 years of the 20th century the United States made in the field of military testing new technology concept, which aims to improve equipment maintenance, testing and skills self-diagnosis, but also the mobility and security equipment system is greatly improved. Since the 70s of the 20th century to the field of aerospace and defense industry other is represented internally built-in self-test and technologies, primarily in the technology to track and stage of theoretical research. 90 years in the 20th century, rockets, satellites, aircraft and other equipment to test aircraft developed essentially around the VXI bus. Meanwhile, in some equipment within the system have appeared in the form of self-expression features built-in test and the embryonic form of [self] 1. BIT is the proposed technology in this work, a certain type of system control equipment, can in the computer control system for the digital device can make use of computers and related equipment for collecting device information interface job information, the modules of the various functional real-time monitoring the timely detection of faults, the location of the fault to the site can replace the unit, quick guide to parts and service personnel.
Built-in testing of key technologies Realizing the system control equipment incorporated into the test and self-diagnosis integrated development should include testing and self-diagnostic equipment and method achieve two major parts. Among built-in test has two aspects: First, the measured object in the installation of test equipment, resulting in less or no external test equipment cases, complete control system and performance testing of equipment; On the other hand, the measured object in the system design for different components design function self-test so that all components have self-diagnosis function, test the whole system self-test features complete the various parts of the completion of testing and information collection, and since then include fault diagnosis, feature extraction, knowledge base and set of inference algorithms and so on. specific application, the first integrated test of the acquisition of information equipment through communication interface to send the team to the ground, while the self-diagnostic algorithm was carried out also in the field of computer. After maturity of the technology to be both, and then the test equipment and diagnostic software All equipment control system of building the house, which is technology bit, BIT technology equipment control system eliminates the need for equipment testing ground for all of the measured signal cables lead through extensive testing to detect the red tape on the floor while the test team in the land becomes no longer a large and complex, and shortening the preparation time before the test team, the operator to meet the needs for rapid response. With the wide application of information technology, digital electronics and development direction equipment. Scanning equipment, using computers and related equipment to gather information from the information interface devices work as possible. Namely to simplify the test and its relationship with the computer connected to the same time to achieve built-in test and create the conditions for self-diagnosis.
As limitations of space equipment, incorporated in the test, the self-diagnostic technology should be to achieve the miniaturization of devices, including systems small, multi-channel high-accuracy A / D and D / A converter miniaturization miniaturization and communications interfaces [2]. Meanwhile, in order to achieve integrated into the full meaning and self-diagnostic testing, integrated methods of stimulation should be treated and the interior design of main equipment, incentives technology; In addition, in order to solve the traditional built-in proof of fault is not complex and can not identify intermittent faults and other problems must be resolved by the storage technology The little built leading design teams to complete the built-in self-diagnostic technology, address the lack of technical knowledge foundation established in [3]. Several key technologies that are directly connected to the built-in test and performance self-testing system is good or bad. This article will focus on hardware design and troubleshooting knowledge base design in detail.
BIT system
Built-in test and self-diagnostic system, including signal conditioning modules, the data acquisition module, the data storage module, diagnosis, and that the excitation module and the communication cable output module of six parts (see Figure 1). tension analog signal conditioning circuit is responsible for collecting the full differential signal amplification, limiting the filtering and conditioning work of others. logical volume, frequency, timing, volume and pulse volume collection of signal conditioning circuit for limiting the realization of the conditioning signals and data buffering and other works. Optical isolation is primarily for the measured signals and isolated from the computer so you can ensure that data collection will not be based readings of potential difference or the common-mode voltage. Data storage module is mainly used to store some Built-in test and self-diagnostic system, diagnostic information, including measurement of digital information, the analog information device, change the information, frequency information, the pulse of information, signal detection and lack of information of the information raw information relevant code and other functions. System equipment control module of the core team incentives MCU system, the signal system excitation control also allows the computer through the communication cable to deal with ground teams to achieve self-excitation control. module 232/485 interface can be host computer and PC machine communication. module self-test is mainly to achieve self-diagnostic system function, The design is ADuC812 DA / AD channel forming loops, the extra DI / DO channels formed loop-to-end analog and digital channels working capacity in self-examination. DS12C887 mainly to the system clock chip provides a basis for standard time on the data stored in Flash to add elements of time, the flow of information PCM data transmission to provide timestamps. The microprocessor system modules selected ADI ADuC812 microcontroller (8-channel high performance 5ms time of conversion, 12-bit A / D converter, two 12-bit DAC, flash memory E2PROM 10.5kB with three 16-bit counter / timer interface and 32 programmable I / O microcontroller S 8051/8052, 256 bytes of SRAM) [4].
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